Advanced Optical Metrology
Thin films, sensors, electronics, and many more – this Knowledge Hub will provide you with in-depth information on methods and applications in the R&D field of Advanced Optical Metrology. Under the motto "Science meets Technology", Wiley and Olympus have teamed up to construct this constantly expanding platform of curated and carefully selected content. This collaborative project will sort through the flood of information in this scientific field, targeting all the relevant information to enhance and facilitate the dialogue between fundamental research and industrial applications.
This Advanced Optical Metrology Knowledge Hub will grant you free access to article digests of recent peer-review publications and subject-based eBooks. Every month, we will publish our editor's selection of six research article abstracts – some of them freely accessible on the Wiley Online Library. You will also learn about the dos and don'ts in scientific publishing in our infographic and upcoming additional material. An extensive glossary will further provide you with an overview of all relevant methods and applications for easy navigation.
